X-Rite Measured

VRED supports the use of measured materials. Measured materials contain internal surface reflection information that considers reflection behavior from different viewing angles ensuring a photo-realistic illustration within the render view.

The X-Rite Measured is a wrapper material for several measured materials which are sorted by Id.

A measurement file can be loaded from the file browser. VRED supports files in AXF, CPA, and BTF format.

Note:

VRED X-Rite AxF materials include GGX BRDF model support. This provides the latest state-of-the-art micro-facet BRDF technology to accurately capture and reproduce surface reflection behavior. It also allows for high-fidelity simulation of material reflections at both peek and shallow viewing angles.

To add a new material to the list, use copy and paste. Material specific attributes can be changed when the material is selected in the list.